| 摘要 |
PROBLEM TO BE SOLVED: To easily extract BAST scan chains without having to provide information on BAST circuits from the outside of LSI. SOLUTION: A scan chain extraction program makes a computer execute a definition step for defining a control circuit scan chain present in a test control circuit; an initial value setting step (S1001) for setting an initial value at each sequence circuit element of the control circuit scan chain; a state setting step (S1002) for setting the scan chains to a through state; an extraction step for extracting data; a determination step (S1003) for determining whether data of all the scan chains has been extracted or not; and an alteration step for altering an initial value of the sequence circuit element constituting a test control circuit connected to the sequence circuit element which is a starting point of the scan chains in the case that not all the data has been extracted. COPYRIGHT: (C)2007,JPO&INPIT
|
