发明名称 |
WAFER LEVEL PACKAGE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a wafer level package in which connection reliability of a solder joint and the like can be improved. <P>SOLUTION: A first polymer layer 26, which has an approximately elliptical shape, seeing from the top surface, and a cross section shape like a dome, is formed on a second conductive pattern layer 72. A multilayer structured body 27 is formed by covering the first polymer layer 26 with a second polymer layer 28. The multilayer structured body 27 protects a semiconductor chip 22 from thermal mechanical damage and external shock applying to a joint or a connecting line of the wafer level package in the case of reliability inspection or actual inspection. <P>COPYRIGHT: (C)2007,JPO&INPIT |
申请公布号 |
JP2007201500(A) |
申请公布日期 |
2007.08.09 |
申请号 |
JP20070102653 |
申请日期 |
2007.04.10 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
KIM GU-SUNG;CHO TOGEN;SON MIN-YOUNG;KYO SHIIN |
分类号 |
H01L23/12;H01L21/3205;H01L21/60;H01L23/13;H01L23/31;H01L23/34;H01L23/485;H01L23/52;H05K1/02;H05K3/34 |
主分类号 |
H01L23/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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