| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection circuit capable of setting an arbitrary state to a scan F/F as a control target constituting a scan chain. SOLUTION: A scan F/F (selector 31, regX 32) being specific for control is inserted between the regB 18 inside the scan F/F as the control target constituting the scan chain and the selector 13 inside another scan F/F as a control target. Therefore, an arbitrary value can be set to the regC 19 inside the scan F/F as the control target, and a state required for inspection can be realized. COPYRIGHT: (C)2007,JPO&INPIT
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