发明名称 |
Socket board and test board system having the same |
摘要 |
A socket board may include an upper board supporting at least one test socket. The upper board may have a major surface defining a first reference plane. At least one stem board may support a stem board application circuit. The stem board may have a major surface defining a second reference plane that may intersect the first reference plane. A conductive member may connect the test socket to the stem board application circuit.
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申请公布号 |
US2007184680(A1) |
申请公布日期 |
2007.08.09 |
申请号 |
US20070700906 |
申请日期 |
2007.02.01 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHOI DUK-SOON;LEE SUNG-WOO;JEON TAEK-JOON;HWANG IN-SUEL |
分类号 |
H01R12/00 |
主分类号 |
H01R12/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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