发明名称 Socket board and test board system having the same
摘要 A socket board may include an upper board supporting at least one test socket. The upper board may have a major surface defining a first reference plane. At least one stem board may support a stem board application circuit. The stem board may have a major surface defining a second reference plane that may intersect the first reference plane. A conductive member may connect the test socket to the stem board application circuit.
申请公布号 US2007184680(A1) 申请公布日期 2007.08.09
申请号 US20070700906 申请日期 2007.02.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI DUK-SOON;LEE SUNG-WOO;JEON TAEK-JOON;HWANG IN-SUEL
分类号 H01R12/00 主分类号 H01R12/00
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