发明名称 METHOD OF FABRICATING MASKROM OF SEMICONDUCTOR DEVICE
摘要 <p>A method of fabricating a mask ROM of a semiconductor device is provided to stabilize operational characteristics of the semiconductor device by preventing implantation of coding ions into an unintended part such as an active region. A gate electrode(114) is formed on a semiconductor substrate(110). An interlayer dielectric(118) is formed to cover the semiconductor substrate including the gate electrode. A code pattern(120) is formed on the interlayer dielectric. A coding ion implantation process is performed by using the code pattern as a mask. Spacers are formed on both sidewalls of the gate electrode. The interlayer dielectric is formed with a silicon oxide. The interlayer dielectric is planarized by an etch-back process. The code pattern is formed with a photoresist. The interlayer dielectric is etched by using the code pattern as a mask.</p>
申请公布号 KR20070080163(A) 申请公布日期 2007.08.09
申请号 KR20060011337 申请日期 2006.02.06
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, SUNG CHUL;KOH, KWANG WOOK;KIM, JAE HWANG;KIM, JU RI
分类号 H01L21/336;H01L21/027;H01L21/266 主分类号 H01L21/336
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