METHOD OF FABRICATING MASKROM OF SEMICONDUCTOR DEVICE
摘要
<p>A method of fabricating a mask ROM of a semiconductor device is provided to stabilize operational characteristics of the semiconductor device by preventing implantation of coding ions into an unintended part such as an active region. A gate electrode(114) is formed on a semiconductor substrate(110). An interlayer dielectric(118) is formed to cover the semiconductor substrate including the gate electrode. A code pattern(120) is formed on the interlayer dielectric. A coding ion implantation process is performed by using the code pattern as a mask. Spacers are formed on both sidewalls of the gate electrode. The interlayer dielectric is formed with a silicon oxide. The interlayer dielectric is planarized by an etch-back process. The code pattern is formed with a photoresist. The interlayer dielectric is etched by using the code pattern as a mask.</p>
申请公布号
KR20070080163(A)
申请公布日期
2007.08.09
申请号
KR20060011337
申请日期
2006.02.06
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
PARK, SUNG CHUL;KOH, KWANG WOOK;KIM, JAE HWANG;KIM, JU RI