发明名称 |
DEVICE AND METHOD FOR DESIGNING INTEGRATED CIRCUIT, AND PROGRAM |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To properly design an integrated circuit by more accurately recognizing a correction error of OPC processing. <P>SOLUTION: A method for designing the integrated circuit is provided in which the integrated circuit is manufactured by using a mask and a reticle manufactured by applying the OPC processing to a pattern regulated by layout pattern data 51. The method includes a step 53 of calculating a pattern after OPC processing obtained by using the mask and reticle manufactured by performing the OPC processing and a step 54 of calculating the OPC correction error by comparing the pattern regulated by the layout pattern data with the pattern subjected to OPC processing. <P>COPYRIGHT: (C)2007,JPO&INPIT</p> |
申请公布号 |
JP2007199256(A) |
申请公布日期 |
2007.08.09 |
申请号 |
JP20060016254 |
申请日期 |
2006.01.25 |
申请人 |
FUJITSU LTD |
发明人 |
MIZUNO YUTAKA;TSURU TAKAYUKI;YAMADA TOMOYUKI |
分类号 |
G03F1/36;G03F1/68;G03F1/70;G06F17/50;H01L21/00 |
主分类号 |
G03F1/36 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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