发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE AND CLEANING DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device and a cleaning device for removing residue adhering to a semiconductor substrate or a structural body formed on a semiconductor substrate, in proper conditions for each semiconductor substrate. <P>SOLUTION: A method for manufacturing a semiconductor device includes: carrying out the dry etching of a semiconductor substrate 5 or a structural body formed on the semiconductor substrate; supplying liquid to the semiconductor substrate; and measuring the resistivity or conductivity of the supplied liquid. A removing liquid is supplied for removing etching residue adhering to the semiconductor substrate or the structural body to the semiconductor substrate only in a predetermined time, based on the resistivity or conductivity of the liquid in the case of removing the etching residue. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2007201367(A) 申请公布日期 2007.08.09
申请号 JP20060021024 申请日期 2006.01.30
申请人 TOSHIBA CORP 发明人 MATSUMURA TAKESHI;UOZUMI NOBUHIRO;MIYAZAKI KUNIHIRO
分类号 H01L21/304;H01L21/027;H01L21/3213 主分类号 H01L21/304
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