发明名称 TEMPERATURE HISTORY MEASUREMENT METHOD AND DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for surely and easily measuring the history of atmospheric temperature of an electronic controller, for which the atmosphere temperature is prescribed. SOLUTION: A temperature sensor 20 is mounted on a substrate 51 inside the electronic controller 5 and the atmospheric temperature of the controller 5 is estimated from the substrate temperature by a CPU 9. The CPU 9 periodically acquires the measured values of the temperature sensor and writes them in a nonvolatile memory 17, when the values are predetermined temperature (i.e., 125°C) or higher. The nonvolatile memory 17 is associated with the temperature for each address, and "1" is recorded for the data of associated address, when the predetermined temperature or higher is measured. When the measured temperature exceeds the predetermined temperature, all is recorded in addresses from the corresponding temperature to the predetermined temperature. No rewriting is performed in the addresses that have been recorded once. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007199014(A) 申请公布日期 2007.08.09
申请号 JP20060020494 申请日期 2006.01.30
申请人 HITACHI LTD 发明人 YAMADA SHIGEKI;TOMITA TSUGIO;NOTO YASUO
分类号 G01K1/02;B60S5/00;F02B39/16;F02D35/00;F02D45/00;G01D9/00 主分类号 G01K1/02
代理机构 代理人
主权项
地址