发明名称 SEMICONDUCTOR ELEMENT AND ITS MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a technique which increases a speed of write/read of an element and improves a fresh characteristic of the element by designing the semiconductor element so as to form a recess channel area and a fin type channel area on its lower portion, especially, utilizing an island type recess gate mask exposing a predetermined active area and an element separating structure adjacent to it, concerning a semiconductor element and its manufacturing method. <P>SOLUTION: The semiconductor element includes: an element separating structure 120 which forms an active area on a semiconductor substrate 110; a recess which is formed by etching the active area exposed with an island type recess gate mask and an element separating structure adjacent to it in a predetermined thickness; a fin-type channel area 155 which is formed on the semiconductor substrate of the lower portion of the recess; a gate insulating film 160 which is formed on the upper portion of the active area containing the fin-type channel area 155 and the recess; and a gate electrode 197 which buries the fin-type channel area and the recess, and is formed on the upper portion of gate insulating film of the gate area. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007201396(A) 申请公布日期 2007.08.09
申请号 JP20060153562 申请日期 2006.06.01
申请人 HYNIX SEMICONDUCTOR INC 发明人 LEE SANG DON;CHUNG SUNG WOONG
分类号 H01L21/8242;H01L27/108;H01L29/41;H01L29/423;H01L29/49;H01L29/78 主分类号 H01L21/8242
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