| 摘要 |
PROBLEM TO BE SOLVED: To provide a method of measuring a dielectric constant by suppressing deterioration of a non-load Q value in particular, even when thickness is 50μm or less by measuring the dielectric constant of a dielectric thin layer arranging a conductor on upper and lower faces at high precision and to provide a both-end open type half wavelength resonator. SOLUTION: The both-end open type half wavelength resonator A1 comprises providing a rectangular strip conductor 3 on one face of the dielectric thin layer 1, providing a ring-like ground conductor 4 on the other face of the dielectric thin layer 1, and being arranged so that at least one end in a long axis direction of the slip conductor 3 and a part of the ground conductor 4 are overlapped in viewing from a layered direction. COPYRIGHT: (C)2007,JPO&INPIT
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