发明名称 Complementary metal-oxide-semiconductor transistor structure for high density and high performance integrated circuits
摘要 A semiconductor device may include a substrate and an insulating layer formed on the substrate. A multi-layer fin may be formed on the insulating layer and may include two semiconducting layers isolated by an insulating layer in vertical direction. A first MOS type device comprising a first source region, a first channel region and a first drain region is arranged on the first semiconducting layer in the multi-layer fin. A second MOS type device comprising a second source region, a second channel region and a second drain region is arranged on the second semiconducting layer in the multi-layer fin. A gate electrode is provided so as to be vertically adjacent to the first and second channel regions.
申请公布号 US2007181947(A1) 申请公布日期 2007.08.09
申请号 US20060347164 申请日期 2006.02.03
申请人 THE HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY 发明人 CHING HO CHAN PHILIP;CHAN MAN SUN;WU XUSHENG;ZHANG SHENGDONG
分类号 H01L27/12 主分类号 H01L27/12
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