发明名称 SUBSTRATE FOR EVALUATING MICROLENS
摘要 <P>PROBLEM TO BE SOLVED: To provide a substrate for evaluating a microlens capable of precisely evaluating the light condensing state of the microlens. <P>SOLUTION: The problem is solved by providing the substrate for evaluating the microlens which has a transparent substrate, a light shielding layer formed on the transparent substrate, a focal length adjusting layer formed on the light shielding layer and the microlens formed on the focal length adjusting layer. On the light shielding layer, a measuring opening is formed at a position through which light condensed by the microlens is passed in the emission of light to the microlens. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007199609(A) 申请公布日期 2007.08.09
申请号 JP20060020742 申请日期 2006.01.30
申请人 DAINIPPON PRINTING CO LTD 发明人 YOSHIDA KOJI;KURIHARA MASAAKI;SUZUKI KATSUTOSHI;ABE MAKOTO
分类号 G02B3/00;G02B5/00;G02B5/20;G02F1/1335;G02F1/13357 主分类号 G02B3/00
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