发明名称 |
SUBSTRATE FOR EVALUATING MICROLENS |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a substrate for evaluating a microlens capable of precisely evaluating the light condensing state of the microlens. <P>SOLUTION: The problem is solved by providing the substrate for evaluating the microlens which has a transparent substrate, a light shielding layer formed on the transparent substrate, a focal length adjusting layer formed on the light shielding layer and the microlens formed on the focal length adjusting layer. On the light shielding layer, a measuring opening is formed at a position through which light condensed by the microlens is passed in the emission of light to the microlens. <P>COPYRIGHT: (C)2007,JPO&INPIT |
申请公布号 |
JP2007199609(A) |
申请公布日期 |
2007.08.09 |
申请号 |
JP20060020742 |
申请日期 |
2006.01.30 |
申请人 |
DAINIPPON PRINTING CO LTD |
发明人 |
YOSHIDA KOJI;KURIHARA MASAAKI;SUZUKI KATSUTOSHI;ABE MAKOTO |
分类号 |
G02B3/00;G02B5/00;G02B5/20;G02F1/1335;G02F1/13357 |
主分类号 |
G02B3/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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