发明名称 PROBE UNIT AND ITS MANUFACTURING METHOD
摘要 A probe unit comprises a substrate and a lead formed on the substrate and having a tip part projecting from an edge of the substrate and contacting to an electrode of a sample, and a thick part of which thickness is thicker than the tip part. The probe unit can make continuity with a sample firmly with a proper contact pressure while lowering electrical resistance of leads.
申请公布号 KR100747961(B1) 申请公布日期 2007.08.08
申请号 KR20070021011 申请日期 2007.03.02
申请人 发明人
分类号 G01R1/073;G01R3/00;G01R31/02;H01L21/66 主分类号 G01R1/073
代理机构 代理人
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