发明名称 Data compression read mode for memory testing
摘要 A first series combination of bit match circuits compares a predetermined bit position in data words that are involved in a compression operation. The first series combination compares the values in the predetermined bit position to determine if they are all a logical zero. A second series combination of bit match circuits compares the same predetermined bit position in the data words. The second series combination compares the values to determine if they are all a logical one. If either condition is true, the value of the bit is output through an output buffer. If both conditions are false, the output buffer is placed in a high impedance state to indicate an error condition exists in that bit position.
申请公布号 US7254756(B2) 申请公布日期 2007.08.07
申请号 US20030696971 申请日期 2003.10.30
申请人 MICRON TECHNOLOGY, INC. 发明人 NASO GIOVANNI
分类号 G11C29/00;G11C7/10;G11C29/02;G11C29/40 主分类号 G11C29/00
代理机构 代理人
主权项
地址