发明名称 Method of measuring test coverage of backend verification runsets and automatically identifying ways to improve the test suite
摘要 The quality assurance of all released runset files should ideally be 100% complete to ensure the best quality of the runsets. This means that the designs used for testing should be sufficient to test all of the design rules with the appropriate data in the runset to reach 100% coverage, which is not easy to ensure. The present invention provides a methodology that addresses this problem by quantitatively measuring the test coverage of backend verification runsets. The methodology not only reports the uncovered rules, but also assists the quality assurance engineers in locating reasons as to why those rules are not covered and how coverage can be improved by designing appropriate test cases.
申请公布号 US7254791(B1) 申请公布日期 2007.08.07
申请号 US20050229085 申请日期 2005.09.16
申请人 NATIONAL SEMICONDUCTOR CORPORATION 发明人 AGRAWAL HIMANSHU;RAY PARTHA;DASTIDAR TATHAGATO RAI
分类号 G06F17/50 主分类号 G06F17/50
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