发明名称 Method and system for testing a memory of a microprocessor
摘要 In one embodiment, a method may include generating a test code segment including a number of selected opcodes and executing the test code segment from a particular location within the memory for a first iteration. The method may also include saving a first test result of the execution of the test code segment after the first iteration. In addition, the method may include executing the test code segment for subsequent iterations and after each iteration of the test code segment, shifting the test code segment a predetermined number of locations from the particular location within the memory. The method may further include comparing test results of each subsequent iteration with the first test result and determining whether any of the subsequent test results are different than the first test result.
申请公布号 US7254509(B1) 申请公布日期 2007.08.07
申请号 US20040004265 申请日期 2004.12.01
申请人 ADVANCED MICRO DEVICES, INC. 发明人 JOHNSON TRENT W.
分类号 G01R27/28 主分类号 G01R27/28
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