发明名称 SEMICONDUCTOR DEVICE HAVING STEP-SHAPED GATE AND METHOD OF FABRICATING THE SAME
摘要 A semiconductor device and a manufacturing method thereof are provided to restrain the failure of the device due to the misalignment of a contact hole by keeping a sufficient distance between adjacent gates using an improved gate structure with a stepped portion. A semiconductor device includes a first layer(510) with a first and a second transistors(110,120) adjacently arranged to each other and a second layer(520) with a third transistor(130) connected with the first transistor. The second layer is located on the first layer. The first and third transistors are connected with each other through a contact hole(410). The contact hole is capable of connecting a first gate(112) of the first transistor with a third gate(132) of the third transistor. A first end portion of a second gate(122) of the second transistor is adjacent to the first transistor. The thickness of the first end portion of the second gate is in a range of 1/10 to 3/4 of that of the first gate. The height of the first end portion of the second gate is lower than an upper surface of the first gate.
申请公布号 KR20070079404(A) 申请公布日期 2007.08.07
申请号 KR20060010038 申请日期 2006.02.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, HYE RIM;KIM, SEUG GYU;KWON, HYUNG SHIN
分类号 H01L21/28 主分类号 H01L21/28
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