发明名称 |
SEMICONDUCTOR DEVICE HAVING STEP-SHAPED GATE AND METHOD OF FABRICATING THE SAME |
摘要 |
A semiconductor device and a manufacturing method thereof are provided to restrain the failure of the device due to the misalignment of a contact hole by keeping a sufficient distance between adjacent gates using an improved gate structure with a stepped portion. A semiconductor device includes a first layer(510) with a first and a second transistors(110,120) adjacently arranged to each other and a second layer(520) with a third transistor(130) connected with the first transistor. The second layer is located on the first layer. The first and third transistors are connected with each other through a contact hole(410). The contact hole is capable of connecting a first gate(112) of the first transistor with a third gate(132) of the third transistor. A first end portion of a second gate(122) of the second transistor is adjacent to the first transistor. The thickness of the first end portion of the second gate is in a range of 1/10 to 3/4 of that of the first gate. The height of the first end portion of the second gate is lower than an upper surface of the first gate.
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申请公布号 |
KR20070079404(A) |
申请公布日期 |
2007.08.07 |
申请号 |
KR20060010038 |
申请日期 |
2006.02.02 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, HYE RIM;KIM, SEUG GYU;KWON, HYUNG SHIN |
分类号 |
H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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