INNER SOURCE VOLTAGE GENERATING CIRCUIT OF SEMICONDUCTOR MEMORY DEVICE
摘要
An internal voltage generating circuit of a semiconductor memory device is provided to prevent the decrease of operation speed according to the operation state of the semiconductor memory device, by changing pulse width generating an internal power supply voltage according to an operation mode of the semiconductor memory device. A variable pulse generation circuit(100) generates a pulse signal with pulse width varying according to an input command. A voltage generation circuit generates an internal voltage in response to the pulse signal. The width of the pulse signal varies according to the number of enabled word lines, through a delay circuit.
申请公布号
KR20070079446(A)
申请公布日期
2007.08.07
申请号
KR20060010118
申请日期
2006.02.02
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
JANG, YOUNG MIN;KIM, HYUNG DONG;HWANG, SOO MAN;KIM, JUNG SIK