发明名称 Method for manufacturing silicon-on-insulator wafer
摘要 A method for manufacturing a SOI wafer includes a step of heat-treating a wafer in a furnace to form an SOI wafer including a silicon support, an insulating layer containing oxide, and a superficial silicon layer arranged in that order and a step of unloading the SOI wafer from the furnace maintained at a temperature of 250° C. to 800° C. to transfer the SOI wafer to an atmosphere containing hydrogen or water. The steps are performed in that order.
申请公布号 US7253069(B2) 申请公布日期 2007.08.07
申请号 US20050101870 申请日期 2005.04.08
申请人 SUMITOMO MITSUBISHI SILICON CORPORATION 发明人 MURAKAMI YOSHIO;YAMAZAKI TORU;AOKI YOSHIRO;ENDO AKIHIKO
分类号 H01L21/331;H01L27/12;H01L21/02;H01L21/425;H01L21/762;H01L21/8222 主分类号 H01L21/331
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