发明名称 METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
摘要 A method for manufacturing a semiconductor device is provided to control effectively off-current of a cell transistor by increasing a work function of a gate electrode. A gate insulating layer(102) and a polysilicon layer doped with a P type impurity are formed on a substrate(100) including a cell area having a pin type active area and a peri/core area including a flat type active area. A photoresist pattern for exposing an NMOS transistor region of the peri/core area is formed on the polysilicon layer doped with the P type impurity. The exposed polysilicon layer is converted to an N type impurity-doped polysilicon layer by counter-doping an N type impurity on the polysilicon layer. A first polysilicon pattern(110) doped with the P type impurity, a second polysilicon pattern(112) doped with the P type impurity, and a third polysilicon pattern(114) doped with the N type impurity are formed by patterning the polysilicon layer doped with the P type impurity and the N type impurity. Source/drains are formed at both sides of the first to the third polysilicon patterns.
申请公布号 KR20070079115(A) 申请公布日期 2007.08.06
申请号 KR20060009536 申请日期 2006.02.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 NOH, JIN TAE;YANG, SANG RYOL;HWANG, KI HYUN;KIM, JIN GYUN;LEE, SUNG HAE;KIM, HONG SUK
分类号 H01L21/336 主分类号 H01L21/336
代理机构 代理人
主权项
地址