发明名称 Memory cell using a dielectric having non-uniform thickness
摘要 A memory cell is programmed by injecting charge into a charge storage layer of the memory cell. A desired programmed charge results in the charge storage layer over an edge portion of a channel region of the memory cell. An undesired programmed charge results in the charge storage layer over an inner portion of the channel region. Charge tunneling is used to substantially remove the undesired programmed charge in the charge storage layer. In one form the memory cell has a substrate having a channel region, a first dielectric layer over the substrate and a charge storage layer over the first dielectric layer. A second dielectric layer over the charge storage layer has a first portion that is thicker than a second portion to selectively control the charge tunneling.
申请公布号 US2007176226(A1) 申请公布日期 2007.08.02
申请号 US20060341813 申请日期 2006.01.27
申请人 SWIFT CRAIG T;CHINDALORE GOWRISHANKAR L 发明人 SWIFT CRAIG T.;CHINDALORE GOWRISHANKAR L.
分类号 H01L29/792 主分类号 H01L29/792
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