发明名称 METHOD AND DEVICE FOR INSPECTING SOLDER MATERIAL, CONTROL PROGRAM, AND COMPUTER READABLE RECORDING MEDIUM
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a device and method capable of measuring the viscocity of a solder material in a short time without generating deterioration of the solder material. <P>SOLUTION: A infrared spectroscopic measurement part 10 detects a first intensity of an infrared ray having a specific wavenumber reflected from a solder material which is an inspection object by irradiating the solder material which is the inspection object with light, and a second intensity of the infrared ray having the specific wavenumber reflected from a solder material which is a comparison object by irradiating the solder material which is the comparison object with the light. Then, the viscocity of the solder material which is the inspection object is calculated by sustituting the first infrared absorbance for a calibration curve equation specified based on the second infrared absorbance in a calculation part 40. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2007192596(A) 申请公布日期 2007.08.02
申请号 JP20060009280 申请日期 2006.01.17
申请人 OMRON CORP 发明人 OHASHI KATSUMI;HORINO MASANOBU
分类号 G01N11/00;G01N21/35;G01N21/3563;G01N33/20 主分类号 G01N11/00
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