发明名称 Electronic Test Circuit For An Integrated Circuit And Methods For Testing The Driver Strength And For Testing The Input Sensitivity Of A Receiver Of The Integrated Circuit
摘要 The electronic test circuit for an integrated circuit to be tested has an input for receiving an analog data stream ( 23 ), a programmable digital line emulator (TPE<SUB>1</SUB>) for emulating properties of a transmission path and an output for emitting an analog data stream ( 24 ) having a signal-to-noise ratio which can be adjusted using the programmable digital line emulator (TPE<SUB>1</SUB>).
申请公布号 US2007176807(A1) 申请公布日期 2007.08.02
申请号 US20070622779 申请日期 2007.01.12
申请人 MATTES HEINZ;SATTLER SEBASTIAN 发明人 MATTES HEINZ;SATTLER SEBASTIAN
分类号 H03M1/06;G01R31/317 主分类号 H03M1/06
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