发明名称 |
Electronic Test Circuit For An Integrated Circuit And Methods For Testing The Driver Strength And For Testing The Input Sensitivity Of A Receiver Of The Integrated Circuit |
摘要 |
The electronic test circuit for an integrated circuit to be tested has an input for receiving an analog data stream ( 23 ), a programmable digital line emulator (TPE<SUB>1</SUB>) for emulating properties of a transmission path and an output for emitting an analog data stream ( 24 ) having a signal-to-noise ratio which can be adjusted using the programmable digital line emulator (TPE<SUB>1</SUB>).
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申请公布号 |
US2007176807(A1) |
申请公布日期 |
2007.08.02 |
申请号 |
US20070622779 |
申请日期 |
2007.01.12 |
申请人 |
MATTES HEINZ;SATTLER SEBASTIAN |
发明人 |
MATTES HEINZ;SATTLER SEBASTIAN |
分类号 |
H03M1/06;G01R31/317 |
主分类号 |
H03M1/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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