发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR STRUCTURE HAVING PLATING ENHANCEMENT LAYER
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor structure having a plating enhancement layer. SOLUTION: There is disclosed a method of manufacturing a semiconductor structure comprising: a step for forming an interlayer dielectric (ILD) layer on a semiconductor layer; a step for forming a conductive plating enhancement layer (PEL) on the ILD layer; a step for patterning the ILD and the PEL; a step for depositing a seed layer in the pattern that is formed by the ILD and the PEL; and a step for plating the top of the seed layer with copper. The PEL reduces resistance over an entire wafer, and functions to facilitate copper plating. The PEL is preferably an optically transparent conductive layer. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007194621(A) 申请公布日期 2007.08.02
申请号 JP20060348855 申请日期 2006.12.26
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 SHOM PONOTH;CHEN STEVEN SHYNG-TSONG;PHIZHIMONS JOHN A;SPOONER TERRY A
分类号 H01L23/52;H01L21/288;H01L21/3205 主分类号 H01L23/52
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