BURN-IN METHOD FOR INTEGRATED SEMICONDUCTOR LASER DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a burn-in method for an integrated semiconductor laser device that can constantly hold temperatures of a plurality of semiconductor laser elements when they are to be tested respectively and can shorten a testing time. SOLUTION: The method includes a first driving step wherein a first group of semiconductor lasers among a plurality of semiconductor lasers that are arranged every other element is simultaneously driven at a specified temperature, and a second group of remaining semiconductor lasers is not driven; a second driving step wherein the second group among the semiconductor lasers is simultaneously driven at a specified temperature and the first group is not driven; a measuring step to measure the characteristic of the semiconductor lasers; and an accepted/rejected judgement step to judge the semiconductor laser according to the measuring result of the characteristic. COPYRIGHT: (C)2007,JPO&INPIT