发明名称 METHOD OF CURING HYDROGEN SILSES QUIOXANE AND DENSIFICATION IN NANO-SCALE TRENCHES
摘要 Trenches in a semiconductor substrate are filled by (i) dispensing a film forming material on the semiconductor substrate and into the trenches; (ii) curing the dispensed film forming material in the presence of an oxidant at a first low temperature for a first predetermined period of time; (iii) curing the dispensed film forming material in the presence of an oxidant at a second low temperature for a second predetermined period of time; (iv) curing the dispensed film forming material in the presence of an oxidant at a third high temperature for a third predetermined period of time; and (v) forming filled oxide trenches in the semiconductor substrate. The film forming material is hydrogen silsesquioxane.
申请公布号 WO2006138055(A3) 申请公布日期 2007.08.02
申请号 WO2006US20851 申请日期 2006.06.12
申请人 DOW CORNING CORPORATION;CHEN, WEI;HWANG, BYUNG, KEUN;LEE, JEA-KYUN;MOYER, ERIC, SCOTT;SPAULDING, MICHAEL, JOHN;WANG, SHENG 发明人 CHEN, WEI;HWANG, BYUNG, KEUN;LEE, JEA-KYUN;MOYER, ERIC, SCOTT;SPAULDING, MICHAEL, JOHN;WANG, SHENG
分类号 H01L21/762 主分类号 H01L21/762
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