发明名称 Method for forming a dielectric layer with an air gap, and a structure including the dielectric layer with the air gap
摘要 A method of forming a semiconductor structure includes providing a first dielectric layer with an opening above a substrate. An exposed surface portion of the first dielectric layer in the opening is transformed. A protective dielectric layer is formed along the transformed portion of the first dielectric layer. The opening is filled with a conductive material. The transformed portion of the first dielectric layer is removed to form an air gap between the protective dielectric layer and a remaining portion of the first dielectric layer.
申请公布号 US2007178713(A1) 申请公布日期 2007.08.02
申请号 US20060342099 申请日期 2006.01.27
申请人 JENG SHIN-PUU 发明人 JENG SHIN-PUU
分类号 H01L21/31;H01L21/469 主分类号 H01L21/31
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