发明名称 Trenched MOSFETS with improved ESD protection capability
摘要 A semiconductor power device includes Zener diodes for providing an electrostatic discharge (ESD) protection. The semiconductor power device further includes a thick insulation layer for substantially insulating the Zener diodes from a doped region doped with the body dopant ions of the semiconductor power device whereby the Zener diode is substantially insulated from a doped region below the thick insulation layer for eliminating a channel effect between two terminals of the Zener diode disposed above the doped region. The Zener diode further includes an array of doped regions comprising doped regions doped alternately with a first conductivity type and a second conductivity type with a first and last doped regions doped with a first conductivity type. Specifically, the Zener diode may include an array of doped regions comprising doped regions arranged as N+PN+PN+ regions. Alternately, the Zener diode may include an array of doped regions comprising doped regions arranged as N+PN+PN+PN+ regions.
申请公布号 US2007176239(A1) 申请公布日期 2007.08.02
申请号 US20060344811 申请日期 2006.01.31
申请人 M-MOS SEMICONDUCTOR SDN. BHD. 发明人 HSHIEH FWU-IUAN
分类号 H01L23/62 主分类号 H01L23/62
代理机构 代理人
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