| 摘要 |
<p>A tester for testing a memory under test having blocks and a repair column. The tester comprises a test unit, a flag memory storing a flag indicating whether each column is good or defective, a count memory for storing number of blocks defective in each column, a fail write section for writing a flag indicating a defective in a flag memory if the test result shows a defective and if the flag in the flag memory about the corresponding column shows a defective, a count section for incrementing the number of blocks of the count memory about the corresponding column if the test result shows a defective and if a flag indicating a defective is not stored about the corresponding column, and a selecting section for selecting a column to be replaced with a repair column according to the number of blocks defective in each column.</p> |
