发明名称 TEMPERATURE CONTROLLING DEVICE
摘要 A test control circuitry conducts an electrical current through a thermo electric cooler for the purpose of testing the operability of a thermal control unit. At temperatures higher than a temperature threshold, this electrical current is directed such that the thermo electric cooler cools a temperature sensitive switch. The direction of the electrical current is inverted at temperatures lower than such temperature, causing heat to flow to the temperature sensitive switch. These specified temperatures of the test control circuitry are programmable either manually or automatically from a remote computer linked to the control circuitry. Optionally, a temperature sensor such as a thermocouple or thermistor and their associated electrical circuitry is used as temperature sensitive switch. In such cases its temperature threshold is programmable.
申请公布号 US2007175225(A1) 申请公布日期 2007.08.02
申请号 US20070670436 申请日期 2007.02.02
申请人 BAHAT AMIT 发明人 BAHAT AMIT
分类号 F25B21/02 主分类号 F25B21/02
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