发明名称 AUTOANALYZER AND PROBE CLEANING METHOD
摘要 A specimen is sequentially sampled by a probe, and at least one of the number of times of cleaning and a cleaning time when cleaning the probe is changed based on at least one of the number of times of sampling of the specimen by the probe and a sampling amount of the specimen.
申请公布号 US2007175284(A1) 申请公布日期 2007.08.02
申请号 US20070668246 申请日期 2007.01.29
申请人 OONUMA TAKEHIKO;TAKAYAMA HIROKO 发明人 OONUMA TAKEHIKO;TAKAYAMA HIROKO
分类号 G01N35/10;B08B3/04;B08B9/02 主分类号 G01N35/10
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