发明名称 MAGNETIC FIELD PROBE APPARATUS AND A METHOD FOR MEASURING MAGNETIC FIELD
摘要 A magnetic field probe apparatus includes a loop-like conductor and feeder lines spaced at a distance from the loop-like conductor. The shape of the loop-like conductor and the arrangement of the feeder lines are adjusted in such a manner that the resonance frequency determined by the combination of the inductance of the loop-like conductor line and the capacitance formed between the looped-conductor and the feeder lines, is matched to the frequency of the magnetic field generated by and in the vicinity of a measurement object (e.g. electronic device) or the frequency of the electric signal which generates the magnetic field. With the magnetic field probe apparatus according to this invention, the magnetic field in the vicinity of the measurement object can be measured with high sensitivity.
申请公布号 US2007177414(A1) 申请公布日期 2007.08.02
申请号 US20070622009 申请日期 2007.01.11
申请人 FUNATO HIROKI;SUGA TAKASHI;UESAKA KOUICHI 发明人 FUNATO HIROKI;SUGA TAKASHI;UESAKA KOUICHI
分类号 G11C19/08 主分类号 G11C19/08
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