发明名称 CONTROL DEVICE AND CONTROL METHOD FOR ELECTRON GUN USED FOR SCANNING ELECTRON MICROSCOPE OR THE LIKE
摘要 PROBLEM TO BE SOLVED: To provide a device and a method capable of optimally setting bias voltage of an electron gun without requiring complicated operation. SOLUTION: On the method of controlling emission current from a filament of the electron gun provided with a plurality of resistors arranged between the filament and a Wehnelt electrode having resistance values different from each other, a setting, for dividing a range of acceleration voltage into the same number of areas as that of the resistors, is accepted, and the resistors are switched so that one having a resistance value corresponding to the size of the area of acceleration voltage can be used to the area of the acceleration voltage. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007194072(A) 申请公布日期 2007.08.02
申请号 JP20060011127 申请日期 2006.01.19
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 KAWAMATA SHIGERU;KOMURO HIROYUKI
分类号 H01J37/248 主分类号 H01J37/248
代理机构 代理人
主权项
地址