发明名称 CMOS SEMICONDUCTOR DEVICES HAVING DUAL WORK FUNCTION METAL GATE STACKS
摘要 CMOS semiconductor devices having dual work function metal gate structures that are formed using fabrication techniques that enable independent work function control for PMOS and NMOS device and which significantly reduce or otherwise eliminate impact on gate dielectric reliability.
申请公布号 US2007178634(A1) 申请公布日期 2007.08.02
申请号 US20060550602 申请日期 2006.10.18
申请人 JUNG HYUNG SUK;LEE JONG HO;HAN SUNG KEE;KIM JU YOUN;PARK JUNG MIN 发明人 JUNG HYUNG SUK;LEE JONG HO;HAN SUNG KEE;KIM JU YOUN;PARK JUNG MIN
分类号 H01L21/8238 主分类号 H01L21/8238
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