发明名称 PROBE UNIT FOR INSPECTION OF FLAT DISPLAY PANEL
摘要 A probe unit for inspecting a flat panel display is provided to easily check a large LCD(Liquid Crystal Display) having electrodes densely aligned, by disposing a probe blade formed at an upper layer between the probe blades formed at a lower layer. A probe unit for inspecting a flat panel display is composed of a TCP(Tape Carrier Package) block(4) disposed at the rear side of a housing(2); an IC(Integrated Circuit) unit disposed at the lower end of the TCP block; a first FPC(Flexible Printed Circuit) of which one end is connected to the IC unit and the other end is connected to the upper end of the housing through the TCP block; a second FPC(12) of which one end is connected to the first FPC by a silicon rod; a fixing plate(14) installed at the upper part of the second FPC; a first blade tip(18) having a protruded portion at the front end; a second blade tip(22) having a protruded portion that does not face the protruded portion of the first blade tip; a first slit unit having plural slits arranged at regular intervals, wherein the protruded portion of the first blade tip is fitted to the slit; and a second slit unit having plural slits arranged at the spots separated from the slits of the first slit unit, wherein the protruded portion of the second blade tip is fitted to the slit. The first and second slit units are fixed to the outer lower end of the housing by epoxy bonding.
申请公布号 KR100747653(B1) 申请公布日期 2007.08.02
申请号 KR20060129184 申请日期 2006.12.18
申请人 KODI-S CO., LTD. 发明人 CHOI, JUN HO
分类号 G01R1/073;G02F1/13 主分类号 G01R1/073
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