| 摘要 |
PROBLEM TO BE SOLVED: To provide a measuring probe capable of reducing parasitic inductance during probe connection. SOLUTION: The measuring probe includes a first measurement arm made of conductive material whose one end has a first hook section for locking a first measured terminal and made of elastic material and a first hinge section disposed in a midway, and the other end has a first connecting means connected to a measuring probe body. The measuring probe also comprises a second measurement arm made of conductive material whose one end has a second hook section for locking a second measured terminal and made of elastic material and a second hinge section whose midway is turnably connected to the first hinge section, and the other end has a second connecting means connected to the measuring probe body. The measuring probe also comprises a force applying means that is disposed in the hinge section and applying a force to the first and second measurement arms so that the first and second measured terminals are gripped by the first and second hook sections elastically cooperatively. COPYRIGHT: (C)2007,JPO&INPIT
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