发明名称 Focus-detector system on X-ray equipment for generating projective or tomographic X-ray phase-contrast exposures of an object under examination uses an anode with areas arranged in strips
摘要 <p>A bundled electron beam (BEB) (14) is controlled regarding its excursion in its direction by two pairs of plate electrodes (17.1,17.2;18.1,18.2) that operate vertically to each other. The BEB can use appropriate control of these plate electrodes to scan an anode (16) like scanning a TV picture line by line with a desirable gap and, as a result, can generate desired X-rays. Independent claims are also included for the following: (1) An X-ray system for generating projective phase-contrast exposures; (2) A method for generating projective or tomographic X-ray phase-contrast exposures of an object under examination with the help of a focus-detector system.</p>
申请公布号 DE102006037255(A1) 申请公布日期 2007.08.02
申请号 DE20061037255 申请日期 2006.08.09
申请人 SIEMENS AG;PAUL SCHERER INSTITUT 发明人 BAUMANN, JOACHIM;ENGELHARDT, MARTIN;FREUDENBERGER, JOERG;HEMPEL, ECKHARD;HOHEISEL, MARTIN;MERTELMEIER, THOMAS;POPESCU, STEFAN;SCHUSTER, MANFRED
分类号 G01N23/04 主分类号 G01N23/04
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