发明名称 |
Focus-detector system on X-ray equipment for generating projective or tomographic X-ray phase-contrast exposures of an object under examination uses an anode with areas arranged in strips |
摘要 |
<p>A bundled electron beam (BEB) (14) is controlled regarding its excursion in its direction by two pairs of plate electrodes (17.1,17.2;18.1,18.2) that operate vertically to each other. The BEB can use appropriate control of these plate electrodes to scan an anode (16) like scanning a TV picture line by line with a desirable gap and, as a result, can generate desired X-rays. Independent claims are also included for the following: (1) An X-ray system for generating projective phase-contrast exposures; (2) A method for generating projective or tomographic X-ray phase-contrast exposures of an object under examination with the help of a focus-detector system.</p> |
申请公布号 |
DE102006037257(A1) |
申请公布日期 |
2007.08.02 |
申请号 |
DE20061037257 |
申请日期 |
2006.08.09 |
申请人 |
SIEMENS AG |
发明人 |
BAUMANN, JOACHIM;ENGELHARDT, MARTIN;FREUDENBERGER, JOERG;HEMPEL, ECKHARD;HOHEISEL, MARTIN;MERTELMEIER, THOMAS;POPESCU, STEFAN;SCHUSTER, MANFRED |
分类号 |
G01N23/22;G01N23/20 |
主分类号 |
G01N23/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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