发明名称 METHOD OF MANUFACTURING NITRIDE SEMICONDUCTOR ELEMENT
摘要 <P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a nitride semiconductor element which suppresses deterioration in light-emitting efficiency due to deposition of In in an InGaN active layer. <P>SOLUTION: The method of manufacturing a nitride semiconductor element includes a step of forming an n-type semiconductor layer on a substrate; a step of forming an active layer containing InGaN on the n-type semiconductor layer at a first growth temperature; a step of decreasing the temperature lower than the first growing temperature after forming the active layer; and a step of increasing the temperature to a second growing temperature higher than the first growing temperature and forming a p-type GaN layer on the active layer. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007194493(A) 申请公布日期 2007.08.02
申请号 JP20060012869 申请日期 2006.01.20
申请人 ROHM CO LTD 发明人 TSUTSUMI ICHIYO;ITO NORIKAZU;FUJIWARA TETSUYA;SONOBE MASAYUKI
分类号 H01L33/40;H01L33/06;H01L33/32;H01S5/323 主分类号 H01L33/40
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