发明名称 |
METHOD OF MANUFACTURING NITRIDE SEMICONDUCTOR ELEMENT |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a nitride semiconductor element which suppresses deterioration in light-emitting efficiency due to deposition of In in an InGaN active layer. <P>SOLUTION: The method of manufacturing a nitride semiconductor element includes a step of forming an n-type semiconductor layer on a substrate; a step of forming an active layer containing InGaN on the n-type semiconductor layer at a first growth temperature; a step of decreasing the temperature lower than the first growing temperature after forming the active layer; and a step of increasing the temperature to a second growing temperature higher than the first growing temperature and forming a p-type GaN layer on the active layer. <P>COPYRIGHT: (C)2007,JPO&INPIT |
申请公布号 |
JP2007194493(A) |
申请公布日期 |
2007.08.02 |
申请号 |
JP20060012869 |
申请日期 |
2006.01.20 |
申请人 |
ROHM CO LTD |
发明人 |
TSUTSUMI ICHIYO;ITO NORIKAZU;FUJIWARA TETSUYA;SONOBE MASAYUKI |
分类号 |
H01L33/40;H01L33/06;H01L33/32;H01S5/323 |
主分类号 |
H01L33/40 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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