发明名称 Copper electrodeposition in microelectronics
摘要 An electrolytic plating method and composition for electrolytically plating Cu onto a semiconductor integrated circuit substrate having submicron-sized interconnect features. The composition comprises a source of Cu ions and a suppressor compound comprising polyether groups. The method involves rapid bottom-up deposition at a superfill speed by which Cu deposition in a vertical direction from the bottoms of the features to the top openings of the features is greater than Cu deposition on the side walls.
申请公布号 US2007178697(A1) 申请公布日期 2007.08.02
申请号 US20060346459 申请日期 2006.02.02
申请人 ENTHONE INC. 发明人 PANECCASIO VINCENT JR.;LIN XUAN;FIGURA PAUL;HURTUBISE RICHARD;WITT CHRISTIAN
分类号 H01L21/44 主分类号 H01L21/44
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