发明名称 META-DATA AND METRICS BASED LEARNING
摘要 <p>The invention relates generally to a system and methodology (1000) for learning, and in particular for practicing for tests. The system and method (1000) employs algorithms (1020) for performing various analytics. A computerized system (1000) analyzes Meta-Data (1040) associated with the Tests, Questions and the learner / student response to those and provides information which helps the learner / student learn faster, get a deeper understanding of the subject area and helps them focus and practice for the subject area of needs. As the data for a student (1050, 1051) is collected, the system (1000) can analyze the core strength and weakness of student for the subject, topic or subtopic etc. and in various other dimensions. Additionally, as data from multiple students is aggregated, the methodology defines the mechanism to analyze and quantify the outcome from three areas of learning namely, the learner effort, an instructor effort and the quality of learning contents. Such a meta-data based learning methodology greatly reduces the potential for guess and subjective analysis and improves the learning of an individual based on the quantifiable data, either at the user choice or being driven by the system recommendation.</p>
申请公布号 WO2007087565(A2) 申请公布日期 2007.08.02
申请号 WO2007US60976 申请日期 2007.01.24
申请人 GUPTA, ANSHU 发明人 GUPTA, ANSHU
分类号 G09B3/00 主分类号 G09B3/00
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