发明名称 Color measurement profile with embedded characterization
摘要 A data structure by which a color management system can model color behavior of a color device. More particularly, the data structure includes a measurement component including a collection of measurements, where each measurement represents at least one control signal by which a sample color measurement is obtained by effecting a corresponding color output from or input to the color device, or a set of color coordinates which correlate to the at least one control signal, or both. The data structure also includes a characterization process component which includes platform-independent code for a characterization process by which the collection of measurements is processed to produce a color behavior model for the color device. The invention preferably includes a control parameter component which includes control parameters representing a type or state of the device, where the characterization process component processes the collection of measurements in accordance with the control parameters, in order to generate a color transform corresponding to the type or state of the color device.
申请公布号 US7251358(B2) 申请公布日期 2007.07.31
申请号 US20030705920 申请日期 2003.11.13
申请人 CANON KABUSHIKI KAISHA 发明人 HAIKIN JOHN
分类号 G06F;H04N1/60 主分类号 G06F
代理机构 代理人
主权项
地址