发明名称 SEMICONDUCTOR MANUFACTURING APPARATUS CAPABLE OF DETECTING TEMPERATURE OF CHEMICAL
摘要 A semiconductor manufacturing apparatus having a function of detecting a temperature of chemical is provided to prevent quality deterioration due to variation in the temperature of the chemical by detecting the temperature of the chemical which is distributed onto a wafer. A wafer(W) is supported by a chuck(110), and a nozzle(120) sprays chemical onto the wafer. The chemical is supplied to the nozzle by a chemical line(130). Water is circulated along an outer wall of the chemical line by a circulator(140). A temperature sensor(150) is built in the chuck to detect a temperature of the chemical which is actually distributed onto the wafer. The temperature sensor is electrically connected to the circulator.
申请公布号 KR20070078245(A) 申请公布日期 2007.07.31
申请号 KR20060008331 申请日期 2006.01.26
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, JONG HAW
分类号 H01L21/66 主分类号 H01L21/66
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