发明名称 |
SEMICONDUCTOR MANUFACTURING APPARATUS CAPABLE OF DETECTING TEMPERATURE OF CHEMICAL |
摘要 |
A semiconductor manufacturing apparatus having a function of detecting a temperature of chemical is provided to prevent quality deterioration due to variation in the temperature of the chemical by detecting the temperature of the chemical which is distributed onto a wafer. A wafer(W) is supported by a chuck(110), and a nozzle(120) sprays chemical onto the wafer. The chemical is supplied to the nozzle by a chemical line(130). Water is circulated along an outer wall of the chemical line by a circulator(140). A temperature sensor(150) is built in the chuck to detect a temperature of the chemical which is actually distributed onto the wafer. The temperature sensor is electrically connected to the circulator.
|
申请公布号 |
KR20070078245(A) |
申请公布日期 |
2007.07.31 |
申请号 |
KR20060008331 |
申请日期 |
2006.01.26 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, JONG HAW |
分类号 |
H01L21/66 |
主分类号 |
H01L21/66 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|