Assembly for LSI test and method for the test

摘要

An assembly for an LSI test supplies a test signal output from an LSI tester to a target LSI to be tested and outputs, to the LSI tester, a test result signal generated by processing of the target LSI performed in accordance with the test signal. The assembly for an LSI test includes: a peripheral circuit coupled to the target LSI and allowing the target LSI to operate in the same manner as in the application environment; and a printed circuit board on which the peripheral circuit is mounted.