发明名称 Scalable Flash/NV structures and devices with extended endurance
摘要 Devices and methods are provided with respect to a gate stack for a nonvolatile structure. According to one aspect, a gate stack is provided. One embodiment of the gate stack includes a tunnel medium, a high K charge blocking and charge storing medium, and an injector medium. The high K charge blocking and charge storing medium is disposed on the tunnel medium. The injector medium is operably disposed with respect to the tunnel medium and the high K charge blocking and charge storing medium to provide charge transport by enhanced tunneling. According to one embodiment, the injector medium is disposed on the high K charge blocking and charge storing medium. According to one embodiment, the tunnel medium is disposed on the injector medium. Other aspects and embodiments are provided herein.
申请公布号 US7250338(B2) 申请公布日期 2007.07.31
申请号 US20050209416 申请日期 2005.08.23
申请人 发明人
分类号 H01L21/336;H01L21/28;H01L29/423;H01L29/51;H01L29/792 主分类号 H01L21/336
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