发明名称 Correlation of vent tile settings and rack temperatures
摘要 In a method for correlating vent tiles with racks based upon vent tile settings and rack inlet temperatures, the vent tiles are set to a first setting, the first vent tile settings are recorded and the temperatures at the inlets of the racks are detected at the first vent tile settings. One of the vent tiles is closed to obtain a second setting, the second vent tile settings are recorded and the temperatures at the inlets of the racks are detected at the second vent tile settings. In addition, the vent tiles and the racks are correlated based upon the settings of the vent tiles and the temperatures detected at the first vent tile settings and the second vent tile settings.
申请公布号 US7251547(B2) 申请公布日期 2007.07.31
申请号 US20040960574 申请日期 2004.10.08
申请人 HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. 发明人 BASH CULLEN E.;PATEL CHANDRAKANT D.;SHARMA RATNESH K.;BEITELMAL ABDLMONEM
分类号 G05B15/00;F25D17/00;F25D17/04 主分类号 G05B15/00
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