发明名称 MOS TRANSISTOR HAVING A STRAINED CHANNEL AND METHOD OF FABRICATING THE SAME
摘要 <p>An MOS transistor and its manufacturing method are provided to maximize a strained channel effect without the degradation of junction leakage current characteristics of source/drain regions. A gate pattern(110) is formed on a semiconductor substrate(100). A doped region is formed in the substrate. The doped region is adjacent to a channel region under the gate pattern. Epitaxial growth layers(126a,126b) are formed in the doped region. Each epitaxial growth layer is composed of a first epitaxial growth layer spaced apart from the gate pattern and a second epitaxial growth layer prolonged from the first epitaxial growth layer to the gate pattern. The thickness of the second epitaxial growth layer is smaller than that of the first epitaxial growth layer.</p>
申请公布号 KR100746232(B1) 申请公布日期 2007.07.30
申请号 KR20060080975 申请日期 2006.08.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, KI CHUL;RHEE, HWA SUNG
分类号 H01L29/78 主分类号 H01L29/78
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