specimen manufacturing method for Transmission Electron Microscope,申请号KR20050132473-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	specimen manufacturing method for Transmission Electron Microscope
摘要
申请公布号	KR100744267(B1)	申请公布日期	2007.07.30
申请号	KR20050132473	申请日期	2005.12.28
申请人		发明人
分类号	G01N1/28	主分类号	G01N1/28
代理机构		代理人
主权项
地址

您可能感兴趣的专利

SURGICAL SUTURING NEEDLE

INTAKE SYSTEM FOR MULTI-CYLINDER COMBUSTION ENGINES

Medical tube assemblies

Laryngeal mask assemblies

Remote diagnostics after boot error

POLYMERIC LAMELLAR SUBSTRATE PARTICLES FOR DRUG DELIVERY

MUSICAL INSTRUMENT SELF-TUNING SYSTEM WITH CALIBRATION LIBRARY

Measuring borehole geometry

Ladder attachment bracket

Semiconductor device and method for manufacturing the same

BITUMEN/POLYMER COMPOSITIONS WITH IMPROVED STABILITY AND THEIR APPLICATION IN CARRYING OUT SURFACING OPERATIONS

NEW POLYMER COMPOSITIONS FOR GRAFT COPOLYMERS AS WELL AS MIXTURES THEREOF AND THERMOPLASTIC COMPOUNDS CONTAINING THEM

Device for measuring urine

WELDING PROCESS FOR HARDENABLE OR HARDENED STEELS

TWO POSITION MOTOR VEHICLE SAFETY SCREEN ASSEMBLY

MEMORY CONTROLLER WHICH EXECUTES READ AND WRITE COMMANDS OUT OF ORDER

Optical fibre amplifier organiser

Gun turret for armoured vehicles

Drinks can with carbonating means