发明名称 A METHOD TO FABRICATE GE AND SI DEVICES TOGETHER FOR PERFORMANCE ENHANCEMENT
摘要 <p>A method for forming a semiconductor structure having devices formed on both sides. A first substrate and a second substrate are provided. We form a first dielectric layer over the first substrate. We form a first insulating layer over the second substrate. We bond the first dielectric layer and the first dielectric layer to form a first structure. The first structure comprised of the first substrate, an insulation layer (combined first dielectric and first insulating layers) and the second substrate. We reduce the thickness of the first substrate. We form via plugs through the first substrate and the insulation layer and at least partially through the second substrate. We form first active devices on the surface of the first substrate. We form a first capping layer over the first active devices and the first substrate. We reduce the thickness of the second substrate to expose the via plugs.</p>
申请公布号 SG133473(A1) 申请公布日期 2007.07.30
申请号 SG20060071526 申请日期 2006.10.13
申请人 CHARTERED SEMICONDUCTOR MANUFACTURING LTD 发明人 HOE ANG CHEW;KYUN SOHN DONG;CHOO HSIA LIANG
分类号 主分类号
代理机构 代理人
主权项
地址