发明名称 APPARATUS TESTING FAULTY SUBSTRATE
摘要 An apparatus of testing a faulty substrate is provided to further minutely test a defect by forming to be imaged through a lens installed to be separated at a fixed interval in the front of a camera to condense light. An apparatus of testing a faulty substrate(10) includes a stage(20), a light source(30), a camera(40), and a blocking board(50). The substrate is floated to be transferred. The air nozzle is installed on the stage to float the substrate and a penetrating unit is formed on the stage. The light source is installed on a bottom of the stage to illuminate light to a top direction. The camera images the light transmitting the substrate by the light source. The penetrating unit is combined with the blocking board to improve the flatness of the substrate while the light is transmitted through the penetrating unit.
申请公布号 KR20070077548(A) 申请公布日期 2007.07.27
申请号 KR20060007131 申请日期 2006.01.24
申请人 ADP ENGINEERING CO., LTD. 发明人 KWON, HYO JOONG;KIM, EUN SEOK
分类号 G01N21/88;G01N21/89 主分类号 G01N21/88
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